Surface-roughness fractality effects in electrical conductivity of single metallic and semiconducting films

G. Palasantzas, J. Barnaś

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Abstract

Surface-roughness effects in electrical conductivity of thin metallic and semiconducting films with self-affine fractal surfaces are considered in the framework of the Born approximation. The surface roughness is described by the k-correlation model, and is characterized by the roughness exponent H (0≤H≤1), the in-plane correlation length ξ, and the rms roughness amplitude Δ. In the case of metallic films the conductivity is shown to increase monotonically with H increasing from H=0 to H=1 and with decreasing ratio Δ/ξ. For semiconducting quantum wells the conductivity shows a peculiar interplay of quantum-mechanical effects and scattering due to surface roughness.
Original languageEnglish
Number of pages6
JournalPhysical Review B
Volume56
Issue number12
DOIs
Publication statusPublished - 1997

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