Original language | English |
---|---|
Pages (from-to) | 83-99 |
Number of pages | 17 |
Journal | Radiation Effects and Defects in Solids |
Volume | 69 |
Issue number | 1-2 |
DOIs | |
Publication status | Published - 1983 |
Tellurium in silicon: Part I: Channeling and rutherford backscattering studies of tellurium implanted silicon
GJ Kemerink*, D.O. Boerma, Hendrik de Waard , L. Niesen
*Corresponding author for this work
Research output: Contribution to journal › Article › Academic › peer-review
8
Citations
(Scopus)