The effect of mound roughness on the electrical capacitance of a thin insulating film

Research output: Contribution to journalArticleAcademicpeer-review

14 Citations (Scopus)
314 Downloads (Pure)
Original languageDutch
Pages (from-to)203 - 206
Number of pages4
JournalSolid State Communications
Volume118
Issue number4
DOIs
Publication statusPublished - 2001

Keywords

  • thin films
  • surfaces and interfaces
  • insulators
  • MOLECULAR-BEAM EPITAXY
  • SURFACE-ROUGHNESS
  • INTERFACE ROUGHNESS
  • QUANTUM-WELLS
  • CONDUCTIVITY
  • SCATTERING
  • MOBILITY
  • GROWTH

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