@article{f2ce5b4fa2f64e1aadc30172150ec370,
title = "The effect of mound roughness on the electrical capacitance of a thin insulating film",
keywords = "thin films, surfaces and interfaces, insulators, MOLECULAR-BEAM EPITAXY, SURFACE-ROUGHNESS, INTERFACE ROUGHNESS, QUANTUM-WELLS, CONDUCTIVITY, SCATTERING, MOBILITY, GROWTH",
author = "G. Palasantzas and {de Hosson}, J.T.M.",
note = "Journal 425PY SOLID STATE COMMUN",
year = "2001",
doi = "10.1016/S0038-1098(01)00057-6",
language = "Dutch",
volume = "118",
pages = "203 -- 206",
journal = "Solid State Communications",
issn = "0038-1098",
publisher = "PERGAMON-ELSEVIER SCIENCE LTD",
number = "4",
}