The mechanical response of lithographically defined break junctions

E. H. Huisman*, M. L. Trouwborst, F. L. Bakker, B. J. van Wees, S. J. van der Molen

*Corresponding author for this work

Research output: Contribution to journalArticleAcademicpeer-review

9 Citations (Scopus)
347 Downloads (Pure)

Abstract

We present an experimental study on the mechanical response of lithographically defined break junctions by measuring atomic chain formation, tunneling traces and Gundlach oscillations. The calibration factor, i.e., the ratio between the electrode movement and the bending of the substrate, is found to be 2.5 times larger than expected from a simple mechanical model. This result is consistent with previous finite-element calculations. Comparing different samples, the mechanical response is found to be similar for electrode separations >4 angstrom. However, for smaller electrode separations significant sample-to-sample variations appear. These variations are ascribed to differences in the shape of the two electrodes on the atomic scale which cannot be controlled by the fabrication process.
Original languageEnglish
Article number104305
Pages (from-to)104305-1-104305-7
Number of pages7
JournalJournal of Applied Physics
Volume109
Issue number10
DOIs
Publication statusPublished - 15-May-2011

Keywords

  • ELECTRON-TRANSPORT
  • CONDUCTANCE
  • MOLECULE
  • CONTACTS

Fingerprint

Dive into the research topics of 'The mechanical response of lithographically defined break junctions'. Together they form a unique fingerprint.

Cite this