Abstract
(SnSe)1.16NbSe2 was prepared from the elements at 750-degrees-C. The compound has a misfit layer structure with unit cell dimensions for the SnSe subsystem: a1 = 5.928(1), b1 = 5.970(2), c1 = 12.282(2) angstrom, space group Cm2a, Z = 4 and for the NbSe2 subsystem: a2 = 3.441(1), b2 = 5.971 angstrom (= b1), c2 = 24.572(5) angstrom (= 2c1), space group Fm2m, Z = 4. The structure was solved by X-ray powder diffraction. The compound is isostructural with (PbS)1.14NbS2. The electrical transport properties are metallic. The Hall coefficient is positive and corresponds at 4 K to 0.4 hole/Nb. The Seebeck coefficient is positive down to 80 K.
Original language | English |
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Pages (from-to) | 879-885 |
Number of pages | 7 |
Journal | Materials Research Bulletin |
Volume | 26 |
Issue number | 9 |
DOIs | |
Publication status | Published - Sept-1991 |
Keywords
- TIN
- NIOBIUM
- SELENIDE
- X-RAY-DIFFRACTION
- ELECTRICAL TRANSPORT
- MAGNETIC-PROPERTIES