The role of electron-stimulated desorption in focused electron beam induced deposition

Willem F. van Dorp*, Thomas W. Hansen, Jakob B. Wagner, Jeff T. M. De Hosson

*Corresponding author for this work

Research output: Contribution to journalArticleAcademicpeer-review

24 Citations (Scopus)
209 Downloads (Pure)

Abstract

We present the results of our study about the deposition rate of focused electron beam induced processing (FEBIP) as a function of the substrate temperature with the substrate being an electron-transparent amorphous carbon membrane. When W(CO)(6) is used as a precursor it is observed that the growth rate is lower at higher substrate temperatures. From Arrhenius plots we calculated the activation energy for desorption, E-des, of W(CO)(6). We found an average value for E-des of 20.3 kJ or 0.21 eV, which is 2.5-3.0 times lower than literature values. This difference between estimates for E-des from FEBIP experiments compared to literature values is consistent with earlier findings by other authors. The discrepancy is attributed to electron-stimulated desorption, which is known to occur during electron irradiation. The data suggest that, of the W(CO)(6) molecules that are affected by the electron irradiation, the majority desorbs from the surface rather than dissociates to contribute to the deposit. It is important to take this into account during FEBIP experiments, for instance when determining fundamental process parameters such as the activation energy for desorption.

Original languageEnglish
Pages (from-to)474-480
Number of pages7
JournalBeilstein Journal of Nanotechnology
Volume4
DOIs
Publication statusPublished - 14-Aug-2013

Keywords

  • desorption energy
  • focused electron beam induced processing
  • scanning transmission electron microscopy
  • temperature dependence
  • tungsten hexacarbonyl
  • CHEMICAL-VAPOR-DEPOSITION
  • TUNGSTEN HEXACARBONYL
  • FILMS
  • NANOSTRUCTURES
  • FABRICATION
  • MICROSCOPY
  • SI(100)
  • WF6

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