Abstract
We develop a two-channel resistor model for simulating spin transport with general applicability. Using this model, for the case of graphene as a prototypical material, we calculate the spin signal consistent with experimental values. Using the same model we also simulate the charge and spin-dependent 1/f noise, both in the local and nonlocal four-probe measurement schemes, and identify the noise from the spin-relaxation resistances as the major source of spin-dependent 1/f noise.
Original language | English |
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Article number | 235439 |
Journal | Physical Review. B: Condensed Matter and Materials Physics |
Volume | 96 |
Issue number | 23 |
DOIs | |
Publication status | Published - 26-Dec-2017 |
Keywords
- SPIN FLUCTUATIONS
- spin relaxation noise