Abstract
A long-standing question for avant-garde data storage technology concerns the nature of the ultrafast photoinduced phase transformations in the wide class of chalcogenide phase-change materials (PCMs). Overall, a comprehensive understanding of the microstructural evolution and the relevant kinetics mechanisms accompanying the out-of-equilibrium phases is still missing. Here, after overheating a phase-change chalcogenide superlattice by an ultrafast laser pulse, we indirectly track the lattice relaxation by time resolved x-ray absorption spectroscopy (tr-XAS) with a sub-ns time resolution. The approach to the tr-XAS experimental results reported in this work provides an atomistic insight of the mechanism that takes place during the cooling process; meanwhile a first-principles model mimicking the microscopic distortions accounts for a straightforward representation of the observed dynamics. Finally, we envisage that our approach can be applied in future studies addressing the role of dynamical structural strain in PCMs.
Original language | English |
---|---|
Article number | 094310 |
Number of pages | 5 |
Journal | Physical Review. B: Condensed Matter and Materials Physics |
Volume | 94 |
Issue number | 9 |
DOIs | |
Publication status | Published - 29-Sept-2016 |
Keywords
- CHANGE MEMORY MATERIALS
- CHALCOGENIDE SUPERLATTICES
- SWITCHING MECHANISM
- DATA-STORAGE
- THIN-FILMS
- TRANSITIONS
- GENERATION
- PULSES