Unified description of potential profiles and electrical transport in unipolar and ambipolar organic field-effect transistors

Edsger C. P. Smits*, Simon G. J. Mathijssen, Michael Colle, Arjan J. G. Mank, Peter A. Bobbert, Paul W. M. Blom, Bert de Boer, Dago M. de Leeuw, Michael Cölle

*Corresponding author for this work

Research output: Contribution to journalArticleAcademicpeer-review

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Abstract

Validation of models for charge transport in organic transistors is fundamentally important for their technological use. Usually current-voltage measurements are performed to investigate organic transistors. In situ scanning Kelvin probe microscopy measurements provide a powerful complementary technique to distinguish between models based on band and hopping transports. We perform combined current-voltage and Kelvin probe microscopy measurements on unipolar and ambipolar organic field-effect transistors. We demonstrate that by this combination we can stringently test these two different transport models and come up with a unified description of charge transport in disordered organic semiconductors.

Original languageEnglish
Article number125202
Number of pages6
JournalPhysical Review. B: Condensed Matter and Materials Physics
Volume76
Issue number12
DOIs
Publication statusPublished - Sep-2007

Keywords

  • THIN-FILM TRANSISTORS
  • CIRCUITS
  • MOBILITY

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