X-ray-emission studies of chemical bonding in transition-metal silicides

P.J.W. Weijs, H. van Leuken, R.A. de Groot, J.C. Fuggle, S. Reiter, G. Wiech, K.H.J. Buschow

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Abstract

We present Si L2,3 emission-band spectra of a series of 3d and 4d transition-metal (TM) silicides, together wtih Si K emission-band spectra of four 3d TM disilicides. The data are compared with augmented-spherical-wave density-of-states (DOS) calculations, and good agreement is found. The trends we find are explained with a general scheme for chemical bonding in TM silicides. The differences between the experimental data and the calculated DOS curves are tentatively attributed to self-energy effects.
Original languageEnglish
Number of pages9
JournalPhysical Review B
Volume44
Issue number15
DOIs
Publication statusPublished - 1991

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