X-ray-emission studies of chemical bonding in transition-metal silicides

P.J.W. Weijs; H. van Leuken; R.A. de Groot; J.C. Fuggle; S. Reiter; G. Wiech; K.H.J. Buschow

doi:10.1103/PhysRevB.44.8195

X-ray-emission studies of chemical bonding in transition-metal silicides

P.J.W. Weijs, H. van Leuken, R.A. de Groot, J.C. Fuggle, S. Reiter, G. Wiech, K.H.J. Buschow

Zernike Institute for Advanced Materials

Research output: Contribution to journal › Article › Academic

50 Citations (Scopus)

281 Downloads (Pure)

Abstract

We present Si L2,3 emission-band spectra of a series of 3d and 4d transition-metal (TM) silicides, together wtih Si K emission-band spectra of four 3d TM disilicides. The data are compared with augmented-spherical-wave density-of-states (DOS) calculations, and good agreement is found. The trends we find are explained with a general scheme for chemical bonding in TM silicides. The differences between the experimental data and the calculated DOS curves are tentatively attributed to self-energy effects.

Original language	English
Number of pages	9
Journal	Physical Review B
Volume	44
Issue number	15
DOIs	https://doi.org/10.1103/PhysRevB.44.8195
Publication status	Published - 1991

Access to Document

10.1103/PhysRevB.44.8195

1991PhysRevBWeijs.pdfFinal publisher's version, 1.71 MB

Handle.net

Persistent link

Cite this

@article{a35b178e060f421f8aa9c551d83d892d,

title = "X-ray-emission studies of chemical bonding in transition-metal silicides",

abstract = "We present Si L2,3 emission-band spectra of a series of 3d and 4d transition-metal (TM) silicides, together wtih Si K emission-band spectra of four 3d TM disilicides. The data are compared with augmented-spherical-wave density-of-states (DOS) calculations, and good agreement is found. The trends we find are explained with a general scheme for chemical bonding in TM silicides. The differences between the experimental data and the calculated DOS curves are tentatively attributed to self-energy effects.",

author = "P.J.W. Weijs and Leuken, {H. van} and Groot, {R.A. de} and J.C. Fuggle and S. Reiter and G. Wiech and K.H.J. Buschow",

note = "Relation: http://www.rug.nl/scheikunde/ date_submitted:2006 Rights: University of Groningen. Materials Science Centre",

year = "1991",

doi = "10.1103/PhysRevB.44.8195",

language = "English",

volume = "44",

journal = "Physical Review. B: Condensed Matter and Materials Physics",

issn = "0163-1829",

publisher = "AMER PHYSICAL SOC",

number = "15",

}

TY - JOUR

T1 - X-ray-emission studies of chemical bonding in transition-metal silicides

AU - Weijs, P.J.W.

AU - Leuken, H. van

AU - Groot, R.A. de

AU - Fuggle, J.C.

AU - Reiter, S.

AU - Wiech, G.

AU - Buschow, K.H.J.

N1 - Relation: http://www.rug.nl/scheikunde/ date_submitted:2006 Rights: University of Groningen. Materials Science Centre

PY - 1991

Y1 - 1991

N2 - We present Si L2,3 emission-band spectra of a series of 3d and 4d transition-metal (TM) silicides, together wtih Si K emission-band spectra of four 3d TM disilicides. The data are compared with augmented-spherical-wave density-of-states (DOS) calculations, and good agreement is found. The trends we find are explained with a general scheme for chemical bonding in TM silicides. The differences between the experimental data and the calculated DOS curves are tentatively attributed to self-energy effects.

AB - We present Si L2,3 emission-band spectra of a series of 3d and 4d transition-metal (TM) silicides, together wtih Si K emission-band spectra of four 3d TM disilicides. The data are compared with augmented-spherical-wave density-of-states (DOS) calculations, and good agreement is found. The trends we find are explained with a general scheme for chemical bonding in TM silicides. The differences between the experimental data and the calculated DOS curves are tentatively attributed to self-energy effects.

U2 - 10.1103/PhysRevB.44.8195

DO - 10.1103/PhysRevB.44.8195

M3 - Article

VL - 44

JO - Physical Review. B: Condensed Matter and Materials Physics

JF - Physical Review. B: Condensed Matter and Materials Physics

SN - 0163-1829

IS - 15

ER -