Georgios Palasantzas

Koch, S. A., Van Agterveld, D. T. L., Palasantzas, G. & De Hosson, J. T. M., 2001, Structure Property Relationships of Oxide Surfaces and Interfaces. Springer, blz. AA3.12.1-AA3.12.6 6 blz. (Materials Research Society Symposium - Proceedings; vol. 654).

Onderzoeksoutput › Academic › peer review

Influence of quasi-layer-by-layer roughness on proximity effects in thin film superconducting/normal-metal junctions

Palasantzas, G. & de Hosson, J. T. M., 2001, In: Physica C: Superconductivity and its Applications. 355, 3-4, blz. 211 - 216 6 blz.

Onderzoeksoutput › Academic › peer review

Open Access

Bestand

1 Citaat (Scopus)

358 Downloads (Pure)

Linear growth of thin films under the influence of stress

Palasantzas, G. & de Hosson, J. T. M., 2001, In: Applied Physics Letters. 78, 20, blz. 3044 - 3046 3 blz.

Onderzoeksoutput › Academic › peer review

Open Access

Bestand

7 Citaten (Scopus)

318 Downloads (Pure)

Mound surface roughness effects on the thermal capacitance of thin films

Palasantzas, G. & de Hosson, J. T. M., 1-jun.-2001, In: Journal of Applied Physics. 89, 11, blz. 6130 - 6134 5 blz.

Onderzoeksoutput › Academic › peer review

Open Access

Bestand

8 Citaten (Scopus)

311 Downloads (Pure)

Non-conformal interface roughness effects on the giant magnetoresistance in magnetic multilayers

Palasantzas, G., Barnas, J. & de Hosson, J. T. M., 2001, In: Surface Science. 482, 3, blz. 1026 - 1029 4 blz.

Onderzoeksoutput › Academic › peer review

Open Access

Bestand

3 Citaten (Scopus)

381 Downloads (Pure)

Roughness effects on the electrical conductivity of thin films grown in a quasi-layer-by-layer mode

Palasantzas, G. & Hosson, J. T. M. D., 2001, In: Physical Review B. 6312, 12, blz. art - 125404 6 blz.

Onderzoeksoutput › Academic › peer review

Open Access

Bestand

21 Citaten (Scopus)

427 Downloads (Pure)

Roughness effects on the electrical conductivity of thin films grown in a quasi-layer-by-layer mode (vol B 63, art. no. 125404, 2001)

Palasantzas, G. & de Hosson, J. T. M., 2001, In: Physical Review B. 6323, 23, blz. art - 239901

Onderzoeksoutput › Academic › peer review

Surface sensitivity effects with local probe scanning Auger-scanning electron microscopy

Van Agterveld, D., Palasantzas, G. & De Hosson, J., 2001, ADVANCES IN MATERIALS PROBLEM SOLVING WITH THE ELECTRON MICROSCOPE. Bentley, J., Allen, C., Dahmen, U. & Petrov (uitgave). WARRENDALE: Materials Research Society, blz. 81-86 6 blz. (MATERIALS RESEARCH SOCIETY SYMPOSIUM PROCEEDINGS; vol. 589).

Onderzoeksoutput › Academic › peer review

The effect of mound roughness on the electrical capacitance of a thin insulating film

Palasantzas, G. & de Hosson, J. T. M., 2001, In: Solid State Communications. 118, 4, blz. 203 - 206 4 blz.

Onderzoeksoutput › Academic › peer review

Open Access

Bestand

17 Citaten (Scopus)

520 Downloads (Pure)

Ultra high vacuum scanning Auger/electron microscopy studies of oxidation and B surface segregation of in situ fractured B- doped Ni3Al alloys

Agterveld, D. T. L. V., Koch, S. A., Palasantzas, G. & Hosson, J. T. M. D., 2001, In: Surface Science. 482, 3, blz. 254 - 259 6 blz.

Onderzoeksoutput › Academic › peer review

7 Citaten (Scopus)

Wetting on rough surfaces

Palasantzas, G. & de Hosson, J. T. M., 2001, In: Acta Materialia. 49, 17, blz. 3533 - 3538 6 blz.

Onderzoeksoutput › Academic › peer review

Open Access

Bestand

116 Citaten (Scopus)

509 Downloads (Pure)

2000

Correlated roughness effects in the giant magnetoresistance of magnetic multilayers

Palasantzas, G., Barnas, J. & de Hosson, J. T. M., 2000, In: Acta Physica Polonica A. 97, 3, blz. 495 - 498 4 blz.

Onderzoeksoutput › Academic › peer review

2 Citaten (Scopus)

Effects of Precipitates in Cu upon Impact Fracture: An Ultra-High-Vacuum Study with Local Probe Scanning Auger/Electron Microscopy

Agterveld, D. T. L. V., Palasantzas, G. & Hosson, J. T. M. D., 2000, In: Acta Materialia. 48, 8, blz. 1995 - 2004 10 blz.

Onderzoeksoutput › Academic › peer review

11 Citaten (Scopus)

Electrical conductivity and thin-film growth dynamics

Palasantzas, G., Zhao, Y. P., Wang, G. C., Lu, T. M., Barnas, J. & de Hosson, J. T. M., 2000, In: Physical Review B. 61, 16, blz. 11109 - 11117 9 blz.

Onderzoeksoutput › Academic › peer review

Open Access

Bestand

69 Citaten (Scopus)

542 Downloads (Pure)

Fractality aspects during agglomeration of solid-phase-epitaxy Co-silicide thin films

Palasantzas, G. & de Hosson, J. T. M., 2000, In: Journal of Vacuum Science & Technology B. 18, 5, blz. 2472 - 2476 5 blz.

Onderzoeksoutput › Academic › peer review

Open Access

Bestand

4 Citaten (Scopus)

316 Downloads (Pure)

Influence of proximity effects in superconductor/normal- metal junctions from mound roughness and film growth mechanisms

Palasantzas, G. & de Hosson, J. T. M., mrt.-2000, In: Physica C: Superconductivity and its Applications. 330, 1-2, blz. 99 - 104 6 blz.

Onderzoeksoutput › Academic › peer review

2 Citaten (Scopus)

Local probe scanning Auger-scanning electron microscopy studies of segregation and surface roughness effects after in-situ fracture

van Agterveld, D. T. L., Palasantzas, G. & de Hosson, J. T. M., 2000, Host Publication. Weinheim: Wiley, blz. 87 - 92

Onderzoeksoutput › Academic

Roughness effect on the measurement of interface stress

Palasantzas, G. & de Hosson, J. T. M., 2000, In: Acta Materialia. 48, 14, blz. 3641 - 3645 5 blz.

Onderzoeksoutput › Academic › peer review

Open Access

Bestand

14 Citaten (Scopus)

312 Downloads (Pure)

Roughness effects on magnetic properties of thin films

Palasantzas, G., Zhao, Y. P., de Hosson, J. T. M. & Wang, G. C., 2000, In: Physica B: Condensed Matter. 283, 1-3, blz. 199 - 202 4 blz.

Onderzoeksoutput › Academic › peer review

Open Access

Bestand

36 Citaten (Scopus)

366 Downloads (Pure)

Self-affine roughness effects on electron transmission and electric current in tunnel junctions

Palasantzas, G., Barnas, J. & de Hosson, J. T. M., 15-jul.-2000, In: Journal of Applied Physics. 88, 2, blz. 927 - 931 5 blz.

Onderzoeksoutput › Academic › peer review

Open Access

Bestand

9 Citaten (Scopus)

338 Downloads (Pure)

1999

Conductivity of Quantum Wires with Rough Boundaries

Palasantzas, G. & Barnaś, J., 1999, In: Physica Status Solidi B. 211, 2, 10 blz.

Onderzoeksoutput › Academic

Open Access

Bestand

3 Citaten (Scopus)

348 Downloads (Pure)

Enhancement of proximity effects due to random roughness at a superconductor/metal interface

Palasantzas, G., 1999, In: Solid State Communications. 112, 2, blz. 97-100 4 blz.

Onderzoeksoutput: Article › Academic › peer review

Open Access

Bestand

4 Citaten (Scopus)

309 Downloads (Pure)

Fabrication of Co/Si nanowires by ultrahigh-vacuum scanning tunneling microscopy on hydrogen-passivated Si(100) surfaces

Palasantzas, G., Ilge, B., de Nijs, J. & Geerligs, L. J., 1-feb.-1999, In: Journal of Applied Physics. 85, 3, blz. 1907-1910 4 blz.

Onderzoeksoutput: Article › Academic › peer review

Open Access

Bestand

39 Citaten (Scopus)

315 Downloads (Pure)

Magnesium surface segregation and oxidation in Al-Mg alloys studied with local probe scanning Auger-scanning electron microscopy

van Agterveld, D. T. L., Palasantzas, G. & De Hosson, J. T. M., 1999, In: Applied Surface Science. 152, 3-4, blz. 250-258 9 blz.

Onderzoeksoutput › Academic › peer review

32 Citaten (Scopus)

Roughness-induced fluid interface fluctuations due to polar and apolar interactions

Palasantzas, G. & Backx, G., jan.-1999, In: Physical Review E. 59, 1, blz. 1259-1262 4 blz.

Onderzoeksoutput › Academic › peer review

Open Access

Bestand

1 Citaat (Scopus)

288 Downloads (Pure)

Static and dynamic aspects of the demagnetizing factor in magnetic thin films with random rough surfaces

Palasantzas, G., 15-aug.-1999, In: Journal of Applied Physics. 86, 4, blz. 2196-2199 4 blz.

Onderzoeksoutput › Academic › peer review

Open Access

Bestand

11 Citaten (Scopus)

330 Downloads (Pure)

Submonolayer growth of Co on H-passivated Si(100) surfaces and nanoscale metallization with Co on patterned H–Si(100)

Ilge, B. & Palasantzas, G., apr.-1999, In: Applied Surface Science. 144-145, blz. 543-547 5 blz.

Onderzoeksoutput: Article › Academic › peer review

9 Citaten (Scopus)

51 Downloads (Pure)

Surface/interface-roughness-induced demagnetizing effect in thin magnetic films

Zhao, Y. P., Palasantzas, G., Wang, G. C. & de Hosson, J. T. M., 1999, In: Physical Review B. 60, 2, blz. 1216 - 1226 11 blz.

Onderzoeksoutput › Academic › peer review

Open Access

Bestand

84 Citaten (Scopus)

411 Downloads (Pure)

Surface-roughness effect on capacitance and leakage current of an insulating film

Zhao, Y. P., Wang, G. C., Lu, T. M., Palasantzas, G. & de Hosson, J. T. M., 1999, In: Physical Review B. 60, 12, blz. 9157 - 9164 8 blz.

Onderzoeksoutput › Academic › peer review

Open Access

Bestand

208 Citaten (Scopus)

994 Downloads (Pure)

Surface sensitivity effects with local probe scanning Auger–scanning electron microscopy

Agterveld, D. T. L. V., Palasantzas, G. & Hosson, J. T. M. D., 1999, In: Applied Physics Letters. 75, 8, blz. 1080-1082 3 blz.

Onderzoeksoutput › Academic › peer review

Open Access

Bestand

6 Citaten (Scopus)

385 Downloads (Pure)

Technology for nanoelectronic devices based on ultra-high vacuum scanning tunneling microscopy on the Si(100) surface

Palasantzas, G., Ilge, B., Rogge, S. & Geerlings, L., mei-1999, In: Microelectronic Engineering. 46, 1-4, blz. 133-136 4 blz.

Onderzoeksoutput: Article › Academic › peer review

Open Access

Bestand

8 Citaten (Scopus)

323 Downloads (Pure)

1998

Contact and Alignment Marker Technology for Atomic Scale Device Fabrication

Zuiddam, M. R., Rogge, S., Drift, E. V. D., Ilge, B. & Palasantzas, G., 1998, In: Microelectronic Engineering. 41, 10, 4 blz.

Onderzoeksoutput › Academic

Open Access

Bestand

4 Citaten (Scopus)

405 Downloads (Pure)

Diffusion, nucleation and annealing of Co on the H-passivated Si(100) surface

Palasantzas, G., Ilge, B. & Nijs, J. D., 1998, In: Surface Science. 412, 1, 9 blz.

Onderzoeksoutput › Academic

Open Access

Bestand

23 Citaten (Scopus)

344 Downloads (Pure)

Effects on the fluid interface fluctuations due to the interaction potential form: Exponential interactions

Palasantzas, G. & Backx, G., 1998, In: Physical Review B. 57, 23, 4 blz.

Onderzoeksoutput › Academic

Open Access

Bestand

3 Citaten (Scopus)

306 Downloads (Pure)

Interface Roughness Fractality Effects on the Electron Mobility in Semiconducting Quantum Wells

Palasantzas, G. & Barnaś, J., 1998, In: Physica Status Solidi B. 209, 2, 10 blz.

Onderzoeksoutput › Academic

Open Access

Bestand

12 Citaten (Scopus)

321 Downloads (Pure)

Roughness effects on the critical fracture toughness of materials under uniaxial stress

Palasantzas, G., 15-mei-1998, In: Journal of Applied Physics. 83, 10, blz. 5212-5216 5 blz.

Onderzoeksoutput › Academic

Open Access

Bestand

2 Citaten (Scopus)

347 Downloads (Pure)

Roughness effects on the sliding frictional force of submonolayer liquid films on solid substrates

Palasantzas, G. & Widom, A., 1998, In: Physical Review B. 57, 8, 4 blz.

Onderzoeksoutput › Academic

Open Access

Bestand

3 Citaten (Scopus)

286 Downloads (Pure)

Surface roughness and grain boundary scattering effects on the electrical conductivity of thin films

Palasantzas, G., 1998, In: Physical Review B. 58, 15, 4 blz.

Onderzoeksoutput › Academic

Open Access

Bestand

50 Citaten (Scopus)

713 Downloads (Pure)

The temperature evolution of ultra-thin films in solid-phase reaction of Co with Si (111) studied by scanning tunneling microscopy

Ilge, B., Palasantzas, G. & Nijs, J. D., 1998, In: Surface Science. 414, 1, 11 blz.

Onderzoeksoutput › Academic

Open Access

Bestand

35 Citaten (Scopus)

336 Downloads (Pure)

1997

Estimation of Kinetic Properties of Particles Forming Random Rough Surfaces

Palasantzas, G., 1997, In: Solid State Communications. 103, 10, 4 blz.

Onderzoeksoutput › Academic

Open Access

Bestand

1 Citaat (Scopus)

290 Downloads (Pure)

Fluctuation properties of interfaces and membranes bounded by self-affine surfaces

Palasantzas, G. & Backx, G., 1997, In: Physical Review B. 55, 15, 4 blz.

Onderzoeksoutput › Academic

Open Access

Bestand

9 Citaten (Scopus)

268 Downloads (Pure)

Fluid interface fluctuations within the generalized Derjaguin approximation

Palasantzas, G. & Backx, G., 1997, In: Physical Review B. 56, 11, 4 blz.

Onderzoeksoutput › Academic

Open Access

Bestand

302 Downloads (Pure)

Interface roughness effects in the giant magnetoresistance in magnetic multilayers

Barnaś, J. & Palasantzas, G., 15-okt.-1997, In: Journal of Applied Physics. 82, 8, blz. 3950-3956 7 blz.

Onderzoeksoutput › Academic

Open Access

Bestand

39 Citaten (Scopus)

384 Downloads (Pure)

Roughness effects on the electrostatic-image potential near a dielectric interface

Palasantzas, G., 1-jul.-1997, In: Journal of Applied Physics. 82, 1, blz. 351-355 5 blz.

Onderzoeksoutput › Academic

Open Access

Bestand

22 Citaten (Scopus)

362 Downloads (Pure)

Roughness effects on the thermal stability of thin films

Palasantzas, G., 1-jan.-1997, In: Journal of Applied Physics. 81, 1, blz. 246-250 5 blz.

Onderzoeksoutput › Academic

Open Access

Bestand

9 Citaten (Scopus)

332 Downloads (Pure)

Georgios Palasantzas

Onderzoeksoutput

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