Mian Li, MSc

Zoekresultaten

• 2024

  Stripe noise removal in conductive atomic force microscopy

  Li, M., Rieck, J., Noheda, B., Roerdink, J. B. T. M. & Wilkinson, M. H. F., 16-feb.-2024, In: Scientific Reports. 14, 1, 14 blz., 3931.

  Onderzoeksoutput › Academic › peer review

  Open Access

  Bestand

  • Stripe Noise Removal 100%
  • Stripe Noise 100%
  • Conductive Atomic Force Microscopy 100%
  • Performance Comparison 100%
  • Image Quality 100%
  1 Citaat (Scopus)

  39 Downloads (Pure)
• 2022

  Stripe Noise Removal in Scanning Probe Microscopy of Memristor Materials

  Li, M., Rieck, J., Roerdink, J. B. T. M. & Wilkinson, M. H. F., jun.-2022.

  Onderzoeksoutput › Academic

  Open Access

  Bestand
  144 Downloads (Pure)