Accelerated ion beams for in-beam e-gamma spectroscopy

JS Dionisio*, C Vieu, C Schuck, R Meunier, D Ledu, A Lafoux, JM Lagrange, M Pautrat, B Waast, WR Phillips, BJ Varley, JL Durell, PG Dagnall, SJ Dorning, M. A. JONES, AG Smith, JCS Bacelar, T Rzaca-Urban, H Folger, J VanhorenbeeckW Urban

*Bijbehorende auteur voor dit werk

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Samenvatting

A few accelerated ion beam requirements for in-beam e-gamma spectroscopy are briefly reviewed as well as several features of the MP Tandem accelerator of IPN-Orsay and the accelerated ion-beam transport devices leading to the experimental area of in-beam e-gamma spectroscopy. In particular, the main capabilities of the ion-sources, the ion pulsing system, the ion stripping and stabilizing devices as well as the versatility of the ion beam transport system are discussed from the point of view of the different kinds of in-beam e-gamma experiments performed in that area. (C) 1998 Elsevier Science B.V. All rights reserved.

Originele taal-2English
Pagina's (van-tot)59-73
Aantal pagina's15
TijdschriftNuclear instruments & methods in physics research section a-Accelerators spectrometers detectors and associated equipment
Volume413
Nummer van het tijdschrift1
StatusPublished - 11-aug-1998

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