Calibration-free quantitative surface topography reconstruction in scanning electron microscopy

E. T. Faber, D. Martinez-Martinez*, C. Mansilla, V. Ocelik, J. Th. M. De Hosson

*Bijbehorende auteur voor dit werk

    OnderzoeksoutputAcademicpeer review

    3 Citaten (Scopus)

    Samenvatting

    This work presents a new approach to obtain reliable surface topography reconstructions from 2D Scanning Electron Microscopy (SEM) images. In this method a set of images taken at different tilt angles are compared by means of digital image correlation (DlC). It is argued that the strength of the method lies in the fact that precise knowledge about the nature of the rotation (vector and/or magnitude) is not needed. Therefore, the great advantage is that complex calibrations of the measuring equipment are avoided. The paper presents the necessary equations involved in the methods, including derivations and solutions. The method is illustrated with examples of 3D reconstructions followed by a discussion on the relevant experimental parameters. (C) 2014 Elsevier B.V. All rights reserved

    Originele taal-2English
    Pagina's (van-tot)31-41
    Aantal pagina's11
    TijdschriftUltramicroscopy
    Volume148
    DOI's
    StatusPublished - jan-2015

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