Characterization of electromigration-induced gold nanogaps

S.J. van der Molen, M.L. Trouwborst, D. Dulic, B.J. van Wees

OnderzoeksoutputAcademicpeer review

Samenvatting

We study the formation and. stability of nanometer-sized gaps, created by electromigration, in thin gold wires. After a wire breaks due to a high local current density, nanogaps of random size are found, all exhibiting tunneling behavior at low bias. Surprisingly, we find that small gaps (<appr. 0.5 nm) can be closed again when a voltage of about 2 V is applied. For larger gaps this is not possible, but the gold does become unstable, leading to an apparent negative differential resistance. We relate these effects to field evaporation and field-enhanced diffusion, respectively.

Originele taal-2English
TitelHost Publication
RedacteurenH Kuzmany, J Fink, M Mehring, S Roth
Plaats van productieMELVILLE
UitgeverijAMER INST PHYSICS
Pagina's511-515
Aantal pagina's5
Volume685
ISBN van geprinte versie0-7354-0154-3
StatusPublished - 2003
Evenement17th International Winterschool/Euroconference on Electronic Properties of Novel Materials - , Austria
Duur: 8-mrt-200315-mrt-2003

Publicatie series

NaamAIP CONFERENCE PROCEEDINGS
UitgeverijAMER INST PHYSICS
Volume685
ISSN van geprinte versie0094-243X

Other

Other17th International Winterschool/Euroconference on Electronic Properties of Novel Materials
Land/RegioAustria
Periode08/03/200315/03/2003

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