Comment on "Nanometer resolution piezoresponse force microscopy to study deep submicron ferroelectric and ferroelastic domains" [Appl. Phys. Lett. 94, 162903 (2009)]

A. H. G. Vlooswijk; Gustau Catalan; Beatriz Noheda

doi:10.1063/1.3467005

Comment on "Nanometer resolution piezoresponse force microscopy to study deep submicron ferroelectric and ferroelastic domains" [Appl. Phys. Lett. 94, 162903 (2009)]

A. H. G. Vlooswijk^*, Gustau Catalan, Beatriz Noheda

^*Bijbehorende auteur voor dit werk

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Originele taal-2	English
Artikelnummer	046101
Pagina's (van-tot)	046101-1-046101-2
Aantal pagina's	2
Tijdschrift	Applied Physics Letters
Volume	97
Nummer van het tijdschrift	4
DOI's	https://doi.org/10.1063/1.3467005
Status	Published - 26-jul.-2010

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10.1063/1.3467005

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title = "Comment on {"}Nanometer resolution piezoresponse force microscopy to study deep submicron ferroelectric and ferroelastic domains{"} [Appl. Phys. Lett. 94, 162903 (2009)]",

keywords = "electric domains, epitaxial growth, ferroelasticity, ferroelectric thin films, lead compounds, transmission electron microscopy",

author = "Vlooswijk, {A. H. G.} and Gustau Catalan and Beatriz Noheda",

year = "2010",

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T1 - Comment on "Nanometer resolution piezoresponse force microscopy to study deep submicron ferroelectric and ferroelastic domains" [Appl. Phys. Lett. 94, 162903 (2009)]

AU - Vlooswijk, A. H. G.

AU - Catalan, Gustau

AU - Noheda, Beatriz

PY - 2010/7/26

Y1 - 2010/7/26

KW - electric domains

KW - epitaxial growth

KW - ferroelasticity

KW - ferroelectric thin films

KW - lead compounds

KW - transmission electron microscopy

U2 - 10.1063/1.3467005

DO - 10.1063/1.3467005

M3 - Editorial

SN - 0003-6951

VL - 97

SP - 046101-1-046101-2

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 4

M1 - 046101

ER -