Samenvatting
A new method of pattern-based analysis increases speed and accuracy and is invariant to image orientation.
Originele taal-2 | English |
---|---|
Aantal pagina's | 4 |
Tijdschrift | SPIE Newsroom |
DOI's | |
Status | Published - 2007 |
Erik Urbach, Jos Roerdink, Michael Wilkinson
Onderzoeksoutput › Academic
Originele taal-2 | English |
---|---|
Aantal pagina's | 4 |
Tijdschrift | SPIE Newsroom |
DOI's | |
Status | Published - 2007 |