Depth Profile Analysis of Thin Oxide Layers on Polycrystalline Fe–Cr

Gerrit Zijlstra, Tomáš Šamořil, Hana Tesařová, Václav Ocelík*, Jeff Th. M. De Hosson

*Bijbehorende auteur voor dit werk

OnderzoeksoutputAcademicpeer review

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Surfaces of polycrystalline ferritic Fe–Cr steel with grain sizes of about 13 µ m in diameter were investigated with surface sensitive techniques. Thin oxide layers, with a maximum thickness of about 100 nm, were grown by oxidation in air at temperatures up to 450°C and were subsequently characterized using time-of-flight secondary ion mass spectrometry (TOF-SIMS) and atomic force microscopy. Correlative microscopy was applied, which allows for element-specific depth profiles on selected grains with a particular crystal orientation. A strong correlation between the grain orientation and the thickness of the oxide layer was found. The sequence in the oxidation growth rate of ferritic Fe–Cr steel crystal planes is found to be {011} > {111} > {001}, which is unexpectedly opposed to known Fe-based systems. Moreover, for the first time, the Cr/Fe ratio throughout the oxide layer has been determined per grain orientation. A clear order from high to low of {001} > {111} > {011} was detected.
Originele taal-2English
Pagina's (van-tot)112-119
Aantal pagina's8
TijdschriftMicroscopy and Microanalysis
Volume26
Nummer van het tijdschrift1
Vroegere onlinedatum31-jan-2020
DOI's
StatusPublished - feb-2020

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