DRAM-Specific Space of Memory Tests

Zaid Al-Ars; Said Hamdioui; Ad Van De Goor; Georgi Gaydadjiev; Joerg Vollrath

doi:10.1109/TEST.2006.297701

DRAM-Specific Space of Memory Tests

Zaid Al-Ars^*, Said Hamdioui, Ad Van De Goor, Georgi Gaydadjiev, Joerg Vollrath

^*Corresponding author voor dit werk

Onderzoeksoutput › Academic › peer review

10 Citaten (Scopus)

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DRAM testing has always been theoretically considered as a subset of general memory testing, despite the disagreement of this assumption with the DRAM test practice. This paper presents a recently developed space of DRAM faults that describes the unique aspects of DRAM behavior, it validates this fault space using extensive Spice simulation, and it identifies the memory tests necessary to detect these faults. Six different tests are derived and shown to correspond to highly effective DRAM tests in practice.

Originele taal-2	English
Titel	2006 IEEE International Test Conference
Uitgeverij	IEEE
ISBN van geprinte versie	978-1-4244-0291-3
DOI's	https://doi.org/10.1109/TEST.2006.297701
Status	Published - 1-dec.-2007
Extern gepubliceerd	Ja
Evenement	2006 IEEE International Test Conference, ITC - Santa Clara, CA, United States Duur: 22-okt.-2006 → 27-okt.-2006

Publicatie series

Naam	Proceedings - International Test Conference
ISSN van geprinte versie	1089-3539
ISSN van elektronische versie	2378-2250

Conference

Conference	2006 IEEE International Test Conference, ITC
Land/Regio	United States
Stad	Santa Clara, CA
Periode	22/10/2006 → 27/10/2006

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title = "DRAM-Specific Space of Memory Tests",

abstract = "DRAM testing has always been theoretically considered as a subset of general memory testing, despite the disagreement of this assumption with the DRAM test practice. This paper presents a recently developed space of DRAM faults that describes the unique aspects of DRAM behavior, it validates this fault space using extensive Spice simulation, and it identifies the memory tests necessary to detect these faults. Six different tests are derived and shown to correspond to highly effective DRAM tests in practice.",

author = "Zaid Al-Ars and Said Hamdioui and {Van De Goor}, Ad and Georgi Gaydadjiev and Joerg Vollrath",

year = "2007",

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AU - Al-Ars, Zaid

AU - Hamdioui, Said

AU - Van De Goor, Ad

AU - Gaydadjiev, Georgi

AU - Vollrath, Joerg

PY - 2007/12/1

Y1 - 2007/12/1

N2 - DRAM testing has always been theoretically considered as a subset of general memory testing, despite the disagreement of this assumption with the DRAM test practice. This paper presents a recently developed space of DRAM faults that describes the unique aspects of DRAM behavior, it validates this fault space using extensive Spice simulation, and it identifies the memory tests necessary to detect these faults. Six different tests are derived and shown to correspond to highly effective DRAM tests in practice.

AB - DRAM testing has always been theoretically considered as a subset of general memory testing, despite the disagreement of this assumption with the DRAM test practice. This paper presents a recently developed space of DRAM faults that describes the unique aspects of DRAM behavior, it validates this fault space using extensive Spice simulation, and it identifies the memory tests necessary to detect these faults. Six different tests are derived and shown to correspond to highly effective DRAM tests in practice.

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U2 - 10.1109/TEST.2006.297701

DO - 10.1109/TEST.2006.297701

M3 - Conference contribution

SN - 978-1-4244-0291-3

T3 - Proceedings - International Test Conference

BT - 2006 IEEE International Test Conference

PB - IEEE

T2 - 2006 IEEE International Test Conference, ITC

Y2 - 22 October 2006 through 27 October 2006

ER -

DRAM-Specific Space of Memory Tests

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