## Samenvatting

We consider the enhancement of proximity effects due to random roughness at a superconductor/normal-metal interface. The roughness is described by the rms roughness amplitude Delta, the correlation length xi, and the roughness exponent H(0 less than or equal to H less than or equal to 1). Small roughness exponents H ( <0.5) are shown to influence strongly the relative reduction of the superconductor critical temperature Delta T(c)/T(c). Moreover, the effect of the roughness exponent H on Delta T(c)/T(c) appears to be more pronounced than that of the long wavelength roughness ratio sigma/xi suggesting that roughness details at short roughness wavelengths should be taken properly into account in experimental studies of proximity effects. Finally, analytic calculations of the interface roughness contribution on Delta T(c)/T(c) are presented for any roughness exponent 0 less than or equal to H less than or equal to 1. (C) 1999 Elsevier Science Ltd. All rights reserved.

Originele taal-2 | English |
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Pagina's (van-tot) | 97-100 |

Aantal pagina's | 4 |

Tijdschrift | Solid State Communications |

Volume | 112 |

Nummer van het tijdschrift | 2 |

DOI's | |

Status | Published - 1999 |