Estimation of Kinetic Properties of Particles Forming Random Rough Surfaces

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An investigation of kinetic properties (diffusion length and activation energy) for deposited particles that form films with rough surfaces is presented. Calculation of these properties is performed as a function of the roughness exponent H, the rms-roughness σ and the in-plane correlation length ξ of the final film surface morphology. The diffusion length scales as d ∝ ξ/σ^1/H for 0 < H ≤ 1 and possess an exponential behaviour d∝e^1/σ^2 for H = 0 with a low sensitivity on ξ. We illustrate our calculations for room temperature evaporated Ag films, where the estimated diffusion lengths are d ~ 2-3 nm and the corresponding activation energies E < 1 eV.
Originele taal-2English
Aantal pagina's4
TijdschriftSolid State Communications
Volume103
Nummer van het tijdschrift10
DOI's
StatusPublished - 1997

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