Hollow atom dynamics on thin films

E.H. Khemliche, C. Laulhé, S. Hoekstra, R.A. Hoekstra, R.W.H. Morgenstern

OnderzoeksoutputAcademicpeer review

Samenvatting

We present a new series of experiments on the interaction of highly charged ions with thin films. The main goal concerns the investigation of the interplay between the projectile and the surface electronic structure. The dynamics of the hollow atom is analyzed through high-resolution Auger electron spectroscopy. LiF and C(60) thin films have been investigated; the results from LiF permit definite conclusion on the respective role of the band gap and the binding energy in bulk LIF during the projectile neutralization and relaxation. Results from C(60) raise new questions on the actual nature of the processes responsible for the fast filling of the projectile L-shell.

Originele taal-2English
Pagina's (van-tot)66-68
Aantal pagina's3
TijdschriftPhysica Scripta
VolumeT80A
StatusPublished - 1999
EvenementIX International Conference on Physics of Highly Charged Ions - , Germany
Duur: 9-sep-199814-sep-1998

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