ms-Time Resolution Raman Spectroscopy Using sCMOS Cameras

Andrew P. Carpenter, Jenny Goulden, Antoine Varagnat, Niels Klement, Wesley R. Browne, Hideaki Kano

Onderzoeksoutput: Conference contributionAcademicpeer review

Samenvatting

Raman spectroscopy is a powerful tool that has found broad adoption in characterizing biological and material systems due to the molecular information embedded in Raman spectra. Some ways this spectroscopic method has been applied include monitoring chemical reactions, identifying molecular structures, and measuring the distribution of chemical species throughout a sample. Traditionally, CCD cameras have found popular use as a detector in Raman spectrometers because spectra can be detected in a single acquisition by dispersing the spectrum across the CCD’s pixel array. While CCDs have aided in the development of Raman spectroscopy as a sensitive detector, their readout mechanism can also introduce experimental limitations through slow frame rates, signal smearing, and blooming of strong signals. We discuss the integration of a scientific complementary metal oxide semiconductor (sCMOS) camera into a Raman spectrometer and conduct a side-by-side comparison with CCD and EMCCD cameras under a range of experimental conditions. The sCMOS readout structure provides performance advantages in bright conditions and enables the rapid acquisition of Raman spectra with millisecond exposure times. Additional, recent, experiments are reviewed that highlight the capability of sCMOS cameras to accurately capture spatially resolved Raman spectra under conditions where other detection technologies might struggle.

Originele taal-2English
TitelReal-time Measurements, Rogue Phenomena, and Single-Shot Applications X
RedacteurenDaniel R. Solli, Georg Herink, Serge Bielawski
UitgeverijSPIE
ISBN van elektronische versie9781510684447
DOI's
StatusPublished - 19-mrt.-2025
EvenementReal-time Measurements, Rogue Phenomena, and Single-Shot Applications X 2025 - San Francisco, United States
Duur: 28-jan.-202529-jan.-2025

Publicatie series

NaamProceedings of SPIE - The International Society for Optical Engineering
Volume13348
ISSN van geprinte versie0277-786X
ISSN van elektronische versie1996-756X

Conference

ConferenceReal-time Measurements, Rogue Phenomena, and Single-Shot Applications X 2025
Land/RegioUnited States
StadSan Francisco
Periode28/01/202529/01/2025

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