Plastic response of thin films due to thermal cycling

L. Nicola, E. van der Giessen, A. Needleman

OnderzoeksoutputAcademicpeer review

Samenvatting

Discrete dislocation simulations of thin films on semi-infinite substrates under cyclic thermal loading are presented. The thin film is modelled as a two-dimensional single crystal under plane strain conditions. Dislocations of edge character can be generated from initially present sources and glide in the film on a given set of slip systems. At each time step of the simulation, the stress field in the film is calculated through the solution of a boundary value problem, taking into account the long-range stress contribution of the current dislocation structure. The numerical results show a clear size effect in the plastic behaviour of two films with thicknesses of 0.25mum and 0.5mum. The mechanical response of the two films during the cyclic thermal loading is analysed, with an emphasis on the evolution of the dislocation structure.

Originele taal-2English
TitelIUTAM SYMPOSIUM ON MULTISCALE MODELING AND CHARACTERIZATION OF ELASTIC-INELASTIC BEHAVIOR OF ENGINEERING MATERIALS, PROCEEDINGS
RedacteurenS Ahzi, M Cherkaoui, MA Khaleel, HM Zbib, MA Zikry, B Lamatina
Plaats van productieDORDRECHT
UitgeverijSpringer
Pagina's97-104
Aantal pagina's8
ISBN van geprinte versie1-4020-1861-4
StatusPublished - 2004
EvenementIUTAM Symposium on Multiscale Modeling and Characterization of Elastic-Inelastic Behavior of Engineering Materials - , Morocco
Duur: 20-okt-200225-okt-2002

Publicatie series

NaamSOLID MECHANICS AND ITS APPLICATIONS
UitgeverijSPRINGER
Volume114

Other

OtherIUTAM Symposium on Multiscale Modeling and Characterization of Elastic-Inelastic Behavior of Engineering Materials
Land/RegioMorocco
Periode20/10/200225/10/2002

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