Plasticity in polycrystalline thin films: A 2D dislocation dynamics approach

L Nicola; E Van der Giessen; A Needleman

Plasticity in polycrystalline thin films: A 2D dislocation dynamics approach

L Nicola^*, E Van der Giessen, A Needleman

^*Bijbehorende auteur voor dit werk

Zernike Institute for Advanced Materials

Onderzoeksoutput › Academic › peer review

1 Citaat (Scopus)

Samenvatting

Thermal stress evolution in polycrystalline thin films is analyzed using discrete dislocation plasticity. Stress develops in the film during cooling from a stress-free configuration due to the difference in thermal expansion coefficient between the film and its substrate. A plane strain formulation with only edge dislocations is used and each grain of the polycrystal has a specified set of slip systems. The film-substrate interface and the grain boundaries are impenetrable for the dislocations. Results are presented for two film thicknesses, with higher hardening seen for the thinner films.

Originele taal-2	English
Titel	MULTISCALE PHENOMENA IN MATERIALS-EXPERIMENTS AND MODELING RELATED TO MECHANICAL BEHAVIOR
Redacteuren	HM Zbib, DH Lassila, LE Levine, KJ Hemker
Plaats van productie	WARRENDALE
Uitgeverij	Materials Research Society
Pagina's	159-163
Aantal pagina's	5
ISBN van geprinte versie	1-55899-716-4
Status	Published - 2003
Evenement	Symposium on Multiscale Phenomena in Materials-Experiments and Modeling Related to Mechanical Behavior held at the 2003 MRS Spring Meeting - , Canada Duur: 22-apr.-2003 → 24-apr.-2003

Publicatie series

Naam	MATERIALS RESEARCH SOCIETY SYMPOSIUM PROCEEDINGS
Uitgeverij	MATERIALS RESEARCH SOCIETY
Volume	779
ISSN van geprinte versie	0272-9172

Other

Other	Symposium on Multiscale Phenomena in Materials-Experiments and Modeling Related to Mechanical Behavior held at the 2003 MRS Spring Meeting
Land/Regio	Canada
Periode	22/04/2003 → 24/04/2003

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Citeer dit

Nicola, L., Van der Giessen, E., & Needleman, A. (2003). Plasticity in polycrystalline thin films: A 2D dislocation dynamics approach. In HM. Zbib, DH. Lassila, LE. Levine, & KJ. Hemker (editors), MULTISCALE PHENOMENA IN MATERIALS-EXPERIMENTS AND MODELING RELATED TO MECHANICAL BEHAVIOR (blz. 159-163). (MATERIALS RESEARCH SOCIETY SYMPOSIUM PROCEEDINGS; Vol. 779). Materials Research Society.

Nicola, L ; Van der Giessen, E ; Needleman, A. / Plasticity in polycrystalline thin films : A 2D dislocation dynamics approach. MULTISCALE PHENOMENA IN MATERIALS-EXPERIMENTS AND MODELING RELATED TO MECHANICAL BEHAVIOR. redacteur / HM Zbib ; DH Lassila ; LE Levine ; KJ Hemker. WARRENDALE : Materials Research Society, 2003. blz. 159-163 (MATERIALS RESEARCH SOCIETY SYMPOSIUM PROCEEDINGS).

@inproceedings{75c2a8e9efcc47ab89ea71d0fc7d961b,

title = "Plasticity in polycrystalline thin films: A 2D dislocation dynamics approach",

abstract = "Thermal stress evolution in polycrystalline thin films is analyzed using discrete dislocation plasticity. Stress develops in the film during cooling from a stress-free configuration due to the difference in thermal expansion coefficient between the film and its substrate. A plane strain formulation with only edge dislocations is used and each grain of the polycrystal has a specified set of slip systems. The film-substrate interface and the grain boundaries are impenetrable for the dislocations. Results are presented for two film thicknesses, with higher hardening seen for the thinner films.",

author = "L Nicola and {Van der Giessen}, E and A Needleman",

year = "2003",

language = "English",

isbn = "1-55899-716-4",

series = "MATERIALS RESEARCH SOCIETY SYMPOSIUM PROCEEDINGS",

publisher = "Materials Research Society",

pages = "159--163",

editor = "HM Zbib and DH Lassila and LE Levine and KJ Hemker",

booktitle = "MULTISCALE PHENOMENA IN MATERIALS-EXPERIMENTS AND MODELING RELATED TO MECHANICAL BEHAVIOR",

note = "Symposium on Multiscale Phenomena in Materials-Experiments and Modeling Related to Mechanical Behavior held at the 2003 MRS Spring Meeting ; Conference date: 22-04-2003 Through 24-04-2003",

}

Nicola, L, Van der Giessen, E & Needleman, A 2003, Plasticity in polycrystalline thin films: A 2D dislocation dynamics approach. in HM Zbib, DH Lassila, LE Levine & KJ Hemker (redactie), MULTISCALE PHENOMENA IN MATERIALS-EXPERIMENTS AND MODELING RELATED TO MECHANICAL BEHAVIOR. MATERIALS RESEARCH SOCIETY SYMPOSIUM PROCEEDINGS, vol. 779, Materials Research Society, WARRENDALE, blz. 159-163, Symposium on Multiscale Phenomena in Materials-Experiments and Modeling Related to Mechanical Behavior held at the 2003 MRS Spring Meeting, Canada, 22/04/2003.

Plasticity in polycrystalline thin films : A 2D dislocation dynamics approach. / Nicola, L; Van der Giessen, E; Needleman, A.

MULTISCALE PHENOMENA IN MATERIALS-EXPERIMENTS AND MODELING RELATED TO MECHANICAL BEHAVIOR. redactie / HM Zbib; DH Lassila; LE Levine; KJ Hemker. WARRENDALE : Materials Research Society, 2003. blz. 159-163 (MATERIALS RESEARCH SOCIETY SYMPOSIUM PROCEEDINGS; Vol. 779).

Onderzoeksoutput › Academic › peer review

TY - GEN

T1 - Plasticity in polycrystalline thin films

T2 - Symposium on Multiscale Phenomena in Materials-Experiments and Modeling Related to Mechanical Behavior held at the 2003 MRS Spring Meeting

AU - Nicola, L

AU - Van der Giessen, E

AU - Needleman, A

PY - 2003

Y1 - 2003

N2 - Thermal stress evolution in polycrystalline thin films is analyzed using discrete dislocation plasticity. Stress develops in the film during cooling from a stress-free configuration due to the difference in thermal expansion coefficient between the film and its substrate. A plane strain formulation with only edge dislocations is used and each grain of the polycrystal has a specified set of slip systems. The film-substrate interface and the grain boundaries are impenetrable for the dislocations. Results are presented for two film thicknesses, with higher hardening seen for the thinner films.

AB - Thermal stress evolution in polycrystalline thin films is analyzed using discrete dislocation plasticity. Stress develops in the film during cooling from a stress-free configuration due to the difference in thermal expansion coefficient between the film and its substrate. A plane strain formulation with only edge dislocations is used and each grain of the polycrystal has a specified set of slip systems. The film-substrate interface and the grain boundaries are impenetrable for the dislocations. Results are presented for two film thicknesses, with higher hardening seen for the thinner films.

M3 - Conference contribution

SN - 1-55899-716-4

T3 - MATERIALS RESEARCH SOCIETY SYMPOSIUM PROCEEDINGS

SP - 159

EP - 163

BT - MULTISCALE PHENOMENA IN MATERIALS-EXPERIMENTS AND MODELING RELATED TO MECHANICAL BEHAVIOR

A2 - Zbib, HM

A2 - Lassila, DH

A2 - Levine, LE

A2 - Hemker, KJ

PB - Materials Research Society

CY - WARRENDALE

Y2 - 22 April 2003 through 24 April 2003

ER -

Nicola L, Van der Giessen E, Needleman A. Plasticity in polycrystalline thin films: A 2D dislocation dynamics approach. In Zbib HM, Lassila DH, Levine LE, Hemker KJ, redacteurs, MULTISCALE PHENOMENA IN MATERIALS-EXPERIMENTS AND MODELING RELATED TO MECHANICAL BEHAVIOR. WARRENDALE: Materials Research Society. 2003. blz. 159-163. (MATERIALS RESEARCH SOCIETY SYMPOSIUM PROCEEDINGS).