Positron analysis of defects in metals

A. van Veen, A.C. Kruseman, H. Schut, P.E. Mijnarends, B.J. Kooi, J.T.M. de Hosson

OnderzoeksoutputAcademicpeer review

12 Citaten (Scopus)

Samenvatting

New methods are discussed to improve defect analysis. The first method employs mapping of two shape parameters, S and W, of the positron annihilation photopeak. It is demonstrated that the combined use of S and W allows to a better discrimination of defects. The other method is based on background suppression and resolution improvement by the use of two detectors in coincidence. This opens possibilities for characterizing defects by element specific contributions to the momentum distribution of the annihilating e(+)e(-) pair, Examples are given of vacancies in Al-nitride precipitates in iron and manganese oxide precipitates in silver.

Originele taal-2English
TitelPOSITRON ANNIHILATION
RedacteurenYC Jean, M Eldrup, DM Schrader, RN West
Plaats van productieZURICH-UETIKON
UitgeverijTRANS TECH PUBLICATIONS LTD
Pagina's76-80
Aantal pagina's5
Volume255-2
ISBN van geprinte versie0-87849-779-X
StatusPublished - 1997
Evenement11th International Conference on Positron Annihilation (ICPA-11) -
Duur: 25-mei-199730-mei-1997

Publicatie series

NaamMATERIALS SCIENCE FORUM
UitgeverijTRANSTEC PUBLICATIONS LTD
Volume255-2
ISSN van geprinte versie0255-5476

Other

Other11th International Conference on Positron Annihilation (ICPA-11)
Periode25/05/199730/05/1997

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