Quantitative characterization of the growth and morphological evolution of bicrystalline aluminum thin films

DH Alsem; EA Stach; JTM De Hosson

doi:10.1007/s10853-005-1077-x

Quantitative characterization of the growth and morphological evolution of bicrystalline aluminum thin films

DH Alsem^*, EA Stach, JTM De Hosson

^*Bijbehorende auteur voor dit werk

Zernike Institute for Advanced Materials

Onderzoeksoutput › Academic › peer review

3 Citaten (Scopus)

266 Downloads (Pure)

Originele taal-2	English
Pagina's (van-tot)	5033-5036
Aantal pagina's	4
Tijdschrift	Journal of Materials Science
Volume	40
Nummer van het tijdschrift	18
DOI's	https://doi.org/10.1007/s10853-005-1077-x
Status	Published - sep.-2005

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title = "Quantitative characterization of the growth and morphological evolution of bicrystalline aluminum thin films",

keywords = "SINGLE-CRYSTAL SI, VAPOR-DEPOSITION, METAL-FILMS",

author = "DH Alsem and EA Stach and {De Hosson}, JTM",

year = "2005",

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doi = "10.1007/s10853-005-1077-x",

language = "English",

volume = "40",

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T1 - Quantitative characterization of the growth and morphological evolution of bicrystalline aluminum thin films

AU - Alsem, DH

AU - Stach, EA

AU - De Hosson, JTM

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KW - SINGLE-CRYSTAL SI

KW - VAPOR-DEPOSITION

KW - METAL-FILMS

U2 - 10.1007/s10853-005-1077-x

DO - 10.1007/s10853-005-1077-x

M3 - Letter

SN - 0022-2461

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JO - Journal of Materials Science

JF - Journal of Materials Science

IS - 18

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