Weibull analyses of bacterial interaction forces measured using AFM

Henderina van der Mei; Jacob de Vries; Hendrik Busscher

doi:10.1016/j.colsurfb.2010.03.018

Weibull analyses of bacterial interaction forces measured using AFM

Henderina van der Mei, Jacob de Vries, Hendrik Busscher

Man, Biomaterials and Microbes (MBM)

Onderzoeksoutput › Academic › peer review

29 Citaten (Scopus)

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Statistically significant conclusions from interaction forces obtained by AFM are difficult to draw because of large data spreads. Weibull analysis, common in macroscopic bond-strength analyses, takes advantage of this spread to derive a Weibull distribution, yielding the probability of occurrence of a force value and the dependability of the data set. Here we propose Weibull distribution as a new way to present nanoscopic bacterial interaction forces obtained using AFM. (C) 2010 Elsevier B.V. All rights reserved.

Originele taal-2	English
Pagina's (van-tot)	372-375
Aantal pagina's	4
Tijdschrift	Colloids and Surfaces B: Biointerfaces
Volume	78
Nummer van het tijdschrift	2
DOI's	https://doi.org/10.1016/j.colsurfb.2010.03.018
Status	Published - 1-jul.-2010

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@article{d32fb30c835844eca829b1873c196d06,

title = "Weibull analyses of bacterial interaction forces measured using AFM",

abstract = "Statistically significant conclusions from interaction forces obtained by AFM are difficult to draw because of large data spreads. Weibull analysis, common in macroscopic bond-strength analyses, takes advantage of this spread to derive a Weibull distribution, yielding the probability of occurrence of a force value and the dependability of the data set. Here we propose Weibull distribution as a new way to present nanoscopic bacterial interaction forces obtained using AFM. (C) 2010 Elsevier B.V. All rights reserved.",

keywords = "Atomic force microscopy, Bacterial interaction forces, Weibull analysis, ADHESION FORCES, MICROSCOPY",

author = "{van der Mei}, Henderina and {de Vries}, Jacob and Hendrik Busscher",

year = "2010",

month = jul,

day = "1",

doi = "10.1016/j.colsurfb.2010.03.018",

language = "English",

volume = "78",

pages = "372--375",

journal = "Colloids and Surfaces B: Biointerfaces",

issn = "0927-7765",

publisher = "ELSEVIER SCIENCE BV",

number = "2",

}

TY - JOUR

T1 - Weibull analyses of bacterial interaction forces measured using AFM

AU - van der Mei, Henderina

AU - de Vries, Jacob

AU - Busscher, Hendrik

PY - 2010/7/1

Y1 - 2010/7/1

N2 - Statistically significant conclusions from interaction forces obtained by AFM are difficult to draw because of large data spreads. Weibull analysis, common in macroscopic bond-strength analyses, takes advantage of this spread to derive a Weibull distribution, yielding the probability of occurrence of a force value and the dependability of the data set. Here we propose Weibull distribution as a new way to present nanoscopic bacterial interaction forces obtained using AFM. (C) 2010 Elsevier B.V. All rights reserved.

AB - Statistically significant conclusions from interaction forces obtained by AFM are difficult to draw because of large data spreads. Weibull analysis, common in macroscopic bond-strength analyses, takes advantage of this spread to derive a Weibull distribution, yielding the probability of occurrence of a force value and the dependability of the data set. Here we propose Weibull distribution as a new way to present nanoscopic bacterial interaction forces obtained using AFM. (C) 2010 Elsevier B.V. All rights reserved.

KW - Atomic force microscopy

KW - Bacterial interaction forces

KW - Weibull analysis

KW - ADHESION FORCES

KW - MICROSCOPY

U2 - 10.1016/j.colsurfb.2010.03.018

DO - 10.1016/j.colsurfb.2010.03.018

M3 - Article

SN - 0927-7765

VL - 78

SP - 372

EP - 375

JO - Colloids and Surfaces B: Biointerfaces

JF - Colloids and Surfaces B: Biointerfaces

IS - 2

ER -

Weibull analyses of bacterial interaction forces measured using AFM

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