XPS DETERMINATION OF THE THICKNESS OF ADSORBED MOUTHRINSE COMPONENTS ON DENTAL ENAMEL

HJ BUSSCHER^*, HC VANDERMEI, MJ GENET, JF PERDOK, PG ROUXHET

^*Corresponding author voor dit werk

Onderzoeksoutput › Academic › peer review

15 Citaten (Scopus)

Originele taal-2	English
Pagina's (van-tot)	344-346
Aantal pagina's	3
Tijdschrift	Surface and Interface Analysis
Volume	15
Nummer van het tijdschrift	5
Status	Published - mei-1990

Handle.net

@article{b9acab1a05f242bd9a87764a01016366,

title = "XPS DETERMINATION OF THE THICKNESS OF ADSORBED MOUTHRINSE COMPONENTS ON DENTAL ENAMEL",

author = "HJ BUSSCHER and HC VANDERMEI and MJ GENET and JF PERDOK and PG ROUXHET",

year = "1990",

month = may,

language = "English",

volume = "15",

pages = "344--346",

journal = "Surface and Interface Analysis",

issn = "0142-2421",

number = "5",

}

TY - JOUR

T1 - XPS DETERMINATION OF THE THICKNESS OF ADSORBED MOUTHRINSE COMPONENTS ON DENTAL ENAMEL

AU - BUSSCHER, HJ

AU - VANDERMEI, HC

AU - GENET, MJ

AU - PERDOK, JF

AU - ROUXHET, PG

PY - 1990/5

Y1 - 1990/5

M3 - Comment/Letter to the editor

SN - 0142-2421

VL - 15

SP - 344

EP - 346

JO - Surface and Interface Analysis

JF - Surface and Interface Analysis

IS - 5

ER -